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  • Products
    • Micro Spot Reflectometer
    • Optical Surface Inspector
    • Thin Film Analyzer
  • More
    • Home
    • Products
      • Micro Spot Reflectometer
      • Optical Surface Inspector
      • Thin Film Analyzer
  • Home
  • Products
    • Micro Spot Reflectometer
    • Optical Surface Inspector
    • Thin Film Analyzer

Welcome to InnoFocas Inc.

Welcome to InnoFocas Inc.Welcome to InnoFocas Inc.Welcome to InnoFocas Inc.

InnoFocas develops and sells advanced optical instruments and components to serve customers in need.

Welcome to InnoFocas Inc.

Welcome to InnoFocas Inc.Welcome to InnoFocas Inc.Welcome to InnoFocas Inc.

InnoFocas develops and sells advanced optical instruments and components to serve customers in need.

Featured Product

Micro-spot Optical Spectra Reflectometer

The micro-spot optical spectra reflectometer is a compact portable optical instrument for measuring optical reflectance spectra from a small area of device surface. Typical sizes that can be measured are 5, 10, 50, 100, 200, and 300 microns. Wavelength ranges cover UV (200 – 350 nm), visible and near infra-red (350 to 1000 nm), and short-wave infra-red (1000 to 1700 nm), respectively. Spectral resolution of measurement is typically 1.0 nm, but can be as small as 0.2 nm. 


The instrument can also be used to measure dynamic changes of the  spectrum with time  for tracking spectral features (such as peaks or valleys) in the reflection spectrum.

The instrument produces quick and convenient measurements of reflection spectra of small areas. In measurement, the instrument is connected to a computer via a USB connector for data acquisition and processing. The instrument can be used in various application settings, such as research laboratories, factories,  and etc.

Applications

The micro-area optical spectral reflectometer can be used for characterizations of optical and semiconductor devices, and quantitative chemical and material analysis.  Examples of applications include, but are not limited to:

  • Characterizations of nanostructure surface devices and metasurfaces;
  • Characterizations of semiconductor, dielectric, and metal films by measuring optical reflectance spectra;
  • Chemical and material composition and contamination, analysis.

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InnoFocas Inc.

701 McMillian Way NW STE F, Huntsville, AL 35806, USA

support@innofocas.com Phone: 256-603-2291

Innofocas Inc.

256-603-2291

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