Micro-spot optical thin film analyzer is a compact optical instrument for measuring thickness and optical constants (n & k) of dielectric and semiconductor thin-films of small areas from 5 µm to 250 µm. Both thickness and optical constants (n & k) can be obtained from a single measurement in less than one second.
Product Specification:
Curved surface thin film analyzer is a compact optical instrument for measuring the thickness and optical constants (n & k) of dielectric and semiconductor films coated on curved optical surfaces, such as lenses. Both thickness and optical constants can be obtained simultaneously from one measurement in less than 0.1 second.
• Measure thin film thickness from 15 nm to 100 µm;
• Measure both thickness and optical constants (n & k);
• Measurable aperture size of curved surface is from ¼ inches to 4 inches;
• Height of curved surface up to 1.5 inches with a maximum tilt angle of 60 degrees;
• Accuracy of thickness measurement is 0.5 nm or 0.2% (the greater);
• Measurement time for each spot is less than 100 milliseconds.
Curved surface optical spectral reflectometer is a compact optical instrument for measuring optical reflectance from curved surfaces, such as lenses. Measured spectral range covers UV（200 – 400 nm), visible and near infra-red (400 nm to 1000 nm), and short-wave infra-red (1000 nm to 1700 nm). The instrument can be used in various environments such as research laboratories, factories, and etc.
• Measurable aperture size of curved surface: ¼ inches to 4 inches;
• Height of curved surface: up to 1.5 inches with a maximum tilt angle of 60 degrees;
• Spectral range covers UV, visible, and infrared respectively;
• Each measurement time takes less than 100 milliseconds;
• Data output and processing: USB connector and thin-film SpectraSensor software in Windows 10 system and up.
